Senior Research Associate

Dr Vincent Mourik

Engineering
Sch: Electrical Eng & Telecom

Publications

  • Journal articles | 2021
    Dr Vincent Mourik
    Yu P; Chen J; Gomanko M; Badawy G; Bakkers EPAM; Zuo K; Mourik V; Frolov SM, 2021, 'Non-Majorana states yield nearly quantized conductance in proximatized nanowires', Nature Physics, vol. 17, pp. 482 - 488, http://dx.doi.org/10.1038/s41567-020-01107-w
    Journal articles | 2020
    Dr Vincent Mourik
    Asaad S; Mourik V; Joecker B; Johnson MAI; Baczewski AD; Firgau HR; Mądzik MT; Schmitt V; Pla JJ; Hudson FE; Itoh KM; McCallum JC; Dzurak AS; Laucht A; Morello A, 2020, 'Coherent electrical control of a single high-spin nucleus in silicon', Nature, vol. 579, pp. 205 - 209, http://dx.doi.org/10.1038/s41586-020-2057-7
    Journal articles | 2018
    Dr Vincent Mourik
    Gül Ö; Zhang H; Bommer JDS; de Moor MWA; Car D; Plissard SR; Bakkers EPAM; Geresdi A; Watanabe K; Taniguchi T; Kouwenhoven LP, 2018, 'Ballistic Majorana nanowire devices.', Nat Nanotechnol, vol. 13, pp. 192 - 197, http://dx.doi.org/10.1038/s41565-017-0032-8
    Journal articles | 2018
    Dr Vincent Mourik
    Mourik V; Asaad S; Firgau H; Pla JJ; Holmes C; Milburn GJ; McCallum JC; Morello A, 2018, 'Exploring quantum chaos with a single nuclear spin', Physical Review E, vol. 98, http://dx.doi.org/10.1103/PhysRevE.98.042206
    Journal articles | 2017
    Dr Vincent Mourik
    Zuo K; Mourik V; Szombati DB; Nijholt B; Van Woerkom DJ; Geresdi A; Chen J; Ostroukh VP; Akhmerov AR; Plissard SR; Car D; Bakkers EPAM; Pikulin DI; Kouwenhoven LP; Frolov SM, 2017, 'Supercurrent Interference in Few-Mode Nanowire Josephson Junctions', Physical Review Letters, vol. 119, http://dx.doi.org/10.1103/PhysRevLett.119.187704
    Journal articles | 2017
    Dr Vincent Mourik
    Zhang H; Gül Ö; Conesa-Boj S; Nowak MP; Wimmer M; Zuo K; Mourik V; De Vries FK; Van Veen J; De Moor MWA; Bommer JDS; Van Woerkom DJ; Car D; Plissard SR; Bakkers EPAM; Quintero-Pérez M; Cassidy MC; Koelling S; Goswami S; Watanabe K; Taniguchi T; Kouwenhoven LP, 2017, 'Ballistic superconductivity in semiconductor nanowires', Nature Communications, vol. 8, http://dx.doi.org/10.1038/ncomms16025
    Journal articles | 2017
    Dr Vincent Mourik
    Gül O; Zhang H; De Vries FK; Van Veen J; Zuo K; Mourik V; Conesa-Boj S; Nowak MP; Van Woerkom DJ; Quintero-Pérez M; Cassidy MC; Geresdi A; Koelling S; Car D; Plissard SR; Bakkers EPAM; Kouwenhoven LP, 2017, 'Hard Superconducting Gap in InSb Nanowires', Nano Letters, vol. 17, pp. 2690 - 2696, http://dx.doi.org/10.1021/acs.nanolett.7b00540
    Journal articles | 2012
    Dr Vincent Mourik
    Mourik V; Zuo K; Frolov SM; Plissard SR; Bakkers EPAM; Kouwenhoven LP, 2012, 'Signatures of majorana fermions in hybrid superconductor-semiconductor nanowire devices', Science, vol. 336, pp. 1003 - 1007, http://dx.doi.org/10.1126/science.1222360
    Journal articles |
    Dr Vincent Mourik
    Yu P; Chen J; Gomanko M; Badawy G; Bakkers EPAM; Zuo K; Mourik V; Frolov SM, 'Non-Majorana states yield nearly quantized conductance in superconductor-semiconductor nanowire devices', , http://dx.doi.org/10.1038/s41567-020-01107-w
    Journal articles |
    Dr Vincent Mourik
    Jakob AM; Robson SG; Schmitt V; Mourik V; Posselt M; Spemann D; Johnson BC; Firgau HR; Mayes E; McCallum JC; Morello A; Jamieson DN, 'Deterministic Single Ion Implantation with 99.87% Confidence for Scalable Donor-Qubit Arrays in Silicon', , http://arxiv.org/abs/2009.02892v2
    Journal articles |
    Dr Vincent Mourik
    Blocher PD; Asaad S; Mourik V; Johnson MAI; Morello A; Mølmer K, 'Measuring out-of-time-ordered correlation functions without reversing time evolution', , http://arxiv.org/abs/2003.03980v1
  • Conference Papers | 2019
    Dr Vincent Mourik
    Morello A; Tosi G; Mohiyaddin FA; Schmitt V; Mourik V; Botzem T; Laucht A; Pla JJ; Tenberg S; Savytskyy R; Madzik M; Hudson F; Dzurak AS; Itoh KM; Jakob AM; Johnson BC; McCallum JC; Jamieson DN, 2019, 'Scalable quantum computing with ion-implanted dopant atoms in Silicon', in Technical Digest - International Electron Devices Meeting, IEDM, pp. 6.2.1 - 6.2.4, http://dx.doi.org/10.1109/IEDM.2018.8614498

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