Dr Zhuangyi Zhou

Dr Zhuangyi Zhou

Research Associate

2022: PhD in Photovoltaics and Renewable Energy Engineering from UNSW, Sydney.

2018: MSc Renewable Energy and Clean Technology from the University of Manchester, UK.

Photovoltaic and Renewable Energy Engineering

I am currently a postdoc research fellow in the School of Photovoltaics and Renewable Energy Engineering, working on silicon space solar cells.

I obtained my PhD from UNSW in the field of photovoltaics and semiconductor materials, under supervision of Dr. Fiacre Rougieux. My thesis research focused on the electronic properties of defects in silicon solar cells, mainly using advanced characterisation techniques such as Deep Level Transient Spectroscopy.

  • Journal articles | 2024
    Le TT; Zhou Z; Chen A; Yang Z; Rougieux F; Macdonald D; Liu AY, 2024, 'Reassessing iron-gallium recombination activity in silicon', Journal of Applied Physics, 135, http://dx.doi.org/10.1063/5.0198737
    Journal articles | 2023
    Yi C; Zhou Z; Juhl MK; Tong J; Fong KC; Rougieux FE; Bremner S, 2023, 'Nature of contaminants introduced in silicon wafers during molecular beam epitaxy chamber annealing', AIP Advances, 13, http://dx.doi.org/10.1063/5.0117424
    Journal articles | 2022
    Zhou Z; Juhl MK; Vaqueiro-Contreras M; Rougieux F; Coletti G, 2022, 'Electronic Properties of Light- and Elevated Temperature-Induced Degradation in Float-Zone Silicon', IEEE Journal of Photovoltaics, 12, pp. 1369 - 1376, http://dx.doi.org/10.1109/JPHOTOV.2022.3195098
    Journal articles | 2022
    Zhou Z; Rougieux F; Siriwardhana M; Coletti G, 2022, 'Characterisation of striations in n-type silicon wafer processed with polysilicon contacts', Solar Energy Materials and Solar Cells, 248, http://dx.doi.org/10.1016/j.solmat.2022.111965
    Journal articles | 2022
    Zhou Z; Vaqueiro-Contreras M; Juhl MK; Rougieux F, 2022, 'Electronic Properties of the Boron-Oxygen Defect Precursor of the Light-Induced Degradation in Silicon', IEEE Journal of Photovoltaics, 12, pp. 1135 - 1141, http://dx.doi.org/10.1109/JPHOTOV.2022.3190769

Characterisation of silicon materials and silicon solar cells, using advanced measurement methods e.g., DLTS, µ-PL, FTIR, and lifetime spectroscopy for defect studies:

    Striation Defects in n-type Silicon

    Metallic Impurities in Silicon

    Boron-oxygen Light Induced Degradation Defects

    Light- and elevated Temperature Induced Degradation Defects in Float-Zone Silicon