SEM - JEOL IT800
IT-800
Description
The JSM-IT800 is a field-emission scanning electron microscope (FE-SEM) configured for rapid, high-resolution imaging and analysis of samples, with a large chamber that can accommodate in-situ stages, large samples, and multi-sample holders. The IT800’s Schottky field-emission source allows the user to achieve high imaging resolution at a range of kV, at both low (high-resolution imaging) and high (microanalytical imaging) currents. The automated low-vacuum mode allows for convenient high-resolution imaging of poorly-conductive specimens without conductive coating/treatment. The lens configuration of the instrument makes it suitable for imaging of all sample types, including magnetic specimens. The integrated cameras on both the exchange chamber and the instrument door capture large colour images of the samples as they are inserted, enabling straightforward navigation to the sample/area of interest. Plasma cleaning of samples is available via the unit fitted to the instrument’s exchange chamber. SEM Supporter software allows users to create montage images over large sample areas. The IT800 is equipped with an ultra-fast electron backscattered diffraction (EBSD) detector for the analysis of a range of characteristics of crystalline materials (e.g., phase ID, grain orientation/size).
Specifications
-
- Schottky field-emission electron gun 10V-30kV operating voltage
-
- 0.7 nm at 20 kV (with beam deceleration)
- 1.3 nm at 1 kV (with beam deceleration)
- 3.0 nm at 15 kV, 5 nA beam current
-
- In lens electron detector (UED)
- Everhart–Thornley secondary electron detector
- Low-vacuum secondary electron detector
- Retractable backscattered electron detector (BSE)
- Electron backscattered detector (EBSD)
- Probe current detector
- Absorbed current meter
-
- SEM pin stub holder
- Cross section holder
- 26mm/1” diameter holder (e.g., for resin-mounted & polished samples)
- 8” (200 mm) wafer holder
- 4” (10.2 cm) bulk holder
Applications
- Materials Science
- Life Sciences
- Biomaterials
- Earth Sciences
- Medical Sciences
- Palaeontology
- Cultural Heritage Materials
- Medical Sciences
Capabilities
- SE imaging (morphology/topography)
- BSE imaging (compositional contrast, structure)
- Montage imaging (image stitching)
- Electron backscattered diffraction (EBSD)
Publishing Microscopy Data Acquired on the JEOL IT800
-
-
- Chemical fixation, dehydration, critical point drying
- Mounting in resin
- Staining
- Polishing
- Mounting on stub with adhesive
- Coating
-
- Manufacturer: JEOL
- Model: JSM-IT800 (HL)
- Type: Schottky FEG
-
- Accelerating voltage (kV)
- Detector(s) used for imaging (SE, BSE, EBSD, SSD-EDX)
-
- Detector: EDAX/Gatan Velocity
- Software: Apex
- Accelerating voltage (kV)
-
- Any image/map filters applied
-
- Scalebars can be added or removed from images in the export/capture options.
Acknowledgement:
“The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.”
Credit EMU staff: Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.
Don’t forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.
-
Instrument location
Electron Microscope Unit
B82, Basement
June Griffith Building (F10)
UNSW Sydney, NSW 2052
Access – To discuss training or how your project could benefit from using this microscope, please contact the EMU using the enquiries form or email EMUAdmin@unsw.edu.au
