Mr Gabriele De Boo

Berkman IR; Lyasota A; De Boo GG; Bartholomew JG; Johnson BC; McCallum JC; Xu BB; Xie S; Ahlefeldt RL; Sellars MJ; Yin C; Rogge S, 2023, 'Observing Er3+ Sites in Si with an in Situ Single-Photon Detector', Physical Review Applied, vol. 19, http://dx.doi.org/10.1103/PhysRevApplied.19.014037

Hu G; Ahlefeldt RL; De Boo GG; Lyasota A; Johnson BC; McCallum JC; Sellars MJ; Yin C; Rogge S, 2022, 'Single site optical spectroscopy of coupled Er³⁺ion pairs in silicon', Quantum Science and Technology, vol. 7, http://dx.doi.org/10.1088/2058-9565/ac56c7

Hu G; De Boo GG; Johnson BC; McCallum JC; Sellars MJ; Yin C; Rogge S, 2022, 'Erratum: Time-Resolved Photoionization Detection of a Single Er³⁺Ion in Silicon (Nano Letters (2022) 22:1 (396-401) DOI: 10.1021/acs.nanolett.1c04072)', Nano Letters, vol. 22, pp. 1456 - 1456, http://dx.doi.org/10.1021/acs.nanolett.2c00173

Hu G; De Boo GG; Johnson BC; McCallum JC; Sellars MJ; Yin C; Rogge S, 2022, 'Time-Resolved Photoionization Detection of a Single Er³⁺Ion in Silicon', Nano Letters, vol. 22, pp. 396 - 401, http://dx.doi.org/10.1021/acs.nanolett.1c04072

Yang J; Fan W; Zhang Y; Duan C; De Boo GG; Ahlefeldt RL; Longdell JJ; Johnson BC; McCallum JC; Sellars MJ; Rogge S; Yin C; Du J, 2022, 'Zeeman and hyperfine interactions of a single Er 3+ 167 ion in Si', Physical Review B, vol. 105, http://dx.doi.org/10.1103/PhysRevB.105.235306

Yang J; Wang J; Fan W; Zhang Y; Duan C; Hu G; De Boo GG; Johnson BC; McCallum JC; Rogge S; Yin C; Du J, 2022, 'Spectral Broadening of a Single Er3+ Ion in a Si Nanotransistor', Physical Review Applied, vol. 18, http://dx.doi.org/10.1103/PhysRevApplied.18.034018

Xu BB; De Boo GG; Johnson BC; Rančić M; Bedoya AC; Morrison B; McCallum JC; Eggleton BJ; Sellars MJ; Yin C; Rogge S, 2021, 'Ultrashallow Junction Electrodes in Low-Loss Silicon Microring Resonators', Physical Review Applied, vol. 15, http://dx.doi.org/10.1103/PhysRevApplied.15.044014

De Boo GG; Yin C; Rančić M; Johnson BC; McCallum JC; Sellars MJ; Rogge S, 2020, 'High-resolution spectroscopy of individual erbium ions in strong magnetic fields', Physical Review B, vol. 102, http://dx.doi.org/10.1103/PhysRevB.102.155309

Zhang Q; Hu G; De Boo GG; Rančić M; Johnson BC; McCallum JC; Du J; Sellars MJ; Yin C; Rogge S, 2019, 'Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors', Nano Letters, vol. 19, pp. 5025 - 5030, http://dx.doi.org/10.1021/acs.nanolett.9b01281

Berkman IR; Lyasota A; de Boo GG; Bartholomew JG; Johnson BC; McCallum JC; Xu BB; Xie S; Ahlefeldt RL; Sellars MJ; Yin C; Rogge S, 2022, 'In-Situ Single-Photon Detection of Er Sites in Si', in Optics InfoBase Conference Papers, Optica Publishing Group, presented at CLEO: QELS_Fundamental Science, http://dx.doi.org/10.1364/cleo_qels.2022.fm5d.5

Yang J; Fan W; Zhang Y; Duan C; Boo GGD; Ahlefeldt RL; Longdell JJ; Johnson BC; McCallum JC; Sellars MJ; Rogge S; Yin C; Du J, 2022, The Zeeman and hyperfine interactions of a single $^{167}Er^{3+}$ ion in Si, http://dx.doi.org/10.1103/PhysRevB.105.235306

Yang J; Wang J; Fan W; Zhang Y; Duan C; Hu G; Boo GGD; Johnson BC; McCallum JC; Rogge S; Yin C; Du J, 2022, Spectral broadening of a single Er$^{3+}$ ion in a Si nano-transistor, http://dx.doi.org/10.1103/PhysRevApplied.18.034018

Zhang Y; Fan W; Yang J; Guan H; Zhang Q; Qin X; Duan C; de Boo GG; Johnson BC; McCallum JC; Sellars MJ; Rogge S; Yin C; Du J, 2022, Photoionization detection of a single Er$^{3+}$ ion with sub-100-ns time resolution, http://dx.doi.org/10.48550/arxiv.2212.00440

Berkman IR; Lyasota A; de Boo GG; Bartholomew JG; Johnson BC; McCallum JC; Xu B-B; Xie S; Ahlefeldt RL; Sellars MJ; Yin C; Rogge S, 2021, Sub-megahertz homogeneous linewidth for Er in Si via in situ single photon detection, http://dx.doi.org/10.48550/arxiv.2108.07090

Hu G; Ahlefeldt RL; de Boo GG; Lyasota A; Johnson BC; McCallum JC; Sellars MJ; Yin C; Rogge S, 2021, Optical and Zeeman spectroscopy of individual Er ion pairs in silicon, http://dx.doi.org/10.48550/arxiv.2108.07442

Xu B-B; de Boo GG; Johnson BC; Rančić M; Bedoya AC; Morrison B; McCallum JC; Eggleton BJ; Sellars MJ; Yin C; Rogge S, 2020, Ultra-shallow junction electrodes in low-loss silicon micro-ring resonators, http://dx.doi.org/10.48550/arxiv.2011.14792

de Boo GG; Yin C; Rančić M; Johnson BC; McCallum JC; Sellars M; Rogge S, 2019, High resolution spectroscopy of individual erbium ions in strong magnetic fields, http://dx.doi.org/10.48550/arxiv.1912.05795

Zhang Q; Hu G; de Boo GG; Rancic M; Johnson BC; McCallum JC; Du J; Sellars MJ; Yin C; Rogge S, 2018, Single rare-earth ions as atomic-scale probes in ultra-scaled transistors, http://dx.doi.org/10.48550/arxiv.1803.01573

De Boo G; Mccallum J; Rancic M; Rogge S; Sellars M; Stavrias N; Yin C, 2017, Optical addressing of individual targets in solids, Patent No. 2013360022-B2, http://pericles.ipaustralia.gov.au/ols/auspat/pdfSource.do?fileQuery=%87%A0%A4%98%92%9Al%A0%A4%98%92%9AU%95%98%9B%94%9D%90%9C%94lp%84a_%60bbe__aaqaa_%60f_c_e%5D%9F%93%95U%93%9E%96l%93%9E%96

Rahman R; Verduijn J; Wang Y; Yin C; De Boo G; Klimeck G; Rogge S, 2015, Bulk and sub-surface donor bound excitons in silicon under electric fields, http://dx.doi.org/10.48550/arxiv.1510.00065

Rogge S; Sellars MJ; Yin C; McCallum JC; De Boo GG; Rancic M; Stavrias N, 2014, Optical addressing of individual targets in solids, Patent No. WO/2014/089621, Patent Agent:FB RICE & CO, http://patentscope.wipo.int/search/en/WO2014089621

Yin C; Rancic M; de Boo GG; Stavrias N; McCallum JC; Sellars MJ; Rogge S, 2013, Optical addressing of an individual erbium ion in silicon, http://dx.doi.org/10.48550/arxiv.1304.2117

Yin CM; Rancic M; Stavrias N; de Boo GG; McCallum JC; Sellars MJ; Rogge S, 2012, 'Photo-ionisation spectra of single erbium centres by charge sensing with a nano transistor', in 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012 - Proceedings, IEEE, Piscataway, NJ, United States, pp. 197 - 198, presented at 2012 Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2012, Melbourne, VIC., 12 December 2012 - 14 December 2012, http://dx.doi.org/10.1109/COMMAD.2012.6472428