Dr Henner Kampwerth
Research Fellow

Dr Henner Kampwerth

Engineering
Photovoltaic and Renewable Energy Engineering

Dr Henner Kampwerth is the ACAP Optics and Characterisation Program Leader at UNSW Sydney.


Research Interests

    - Characterisation of solar cells and materials, using static and dynamic optical techniques
    - Design of new characterisation methods
    - Design and optimisation of Photothermal Deflection Spectroscopy (PDS)

 

The Group: Optical Characterisation Techniques

    The photovoltaic industry is constantly trying to decrease the cost-per-watt of solar cells. This is either achieved by (a) lowering the manufacturing costs, which involves the use of new manufacturing techniques and lower-quality materials without lowering the established cell efficiency or (b) the use of higher-efficiency cell designs without increasing the cost. Both approaches require the development of new, more accurate and easier-to-interpret measurement techniques. Lower-quality materials with their higher levels of impurities and defects need to be better understood. Also, higher-efficiency cell designs with their stricter process tolerances need to be monitored more precisely.

    Our Centre, with its leading role in research and development for industry and academia, is particularly interested in measurement techniques that can produce accurate and meaningful data. The improvement of measurement techniques has a direct impact on both research activities and the optimisation of procedures used in manufacturing. The time and number of experiments needed to understand a certain phenomenon can be greatly reduced. A correct interpretation of these results is also a central concern.

    This research group focuses primarily on the significant improvement of existing techniques and the development of completely new measurement concepts that would be of value for multiple research projects. From 2012 to end 2016, our research has focused especially on increasing the applicability of advanced time-resolved photoluminescence spectroscopy. Beginning of 2017, Dr Kampwerth focuses on the further development of the well-known technique of Photothermal Deflection Spectroscopy (PDS), a project that was initiated by his colleague and friend Dr Binesh Puthen Veettil. 

    The Photothermal Deflection Spectroscopy (PDS) technique is particularly suited to measure optical absorption properties of thin film semiconductors. Conventual measurement techniques often fail on such thin films. The PDS technique offers a dynamic range, that is 100 to 1000 times more sensitive compared to most other techniques. The PDS system is much used in our school to investigate the optical bandgap properties of various new compound semiconductors. 

Phone
+61 2 9385 7591
Location
Office Location: 249, Tyree Energy Technologies Building (TETB)
  • Journal articles | 2020
    Xue C; Huang J; Sun K; Yan C; Kampwerth H; Hao X, 2020, 'Revealing Nanoscale Domains in Cu2ZnSnS4 Thin Films by Catalyzed Chemical Etching', Physica Status Solidi - Rapid Research Letters, vol. 14, http://dx.doi.org/10.1002/pssr.202000283
    Journal articles | 2015
    Hameiri Z; Mahboubi Soufiani A; Juhl MK; Jiang LC; Huang FZ; Cheng YB; Kampwerth H; Weber J; Green M; Trupke T, 2015, 'Photoluminescence and electroluminescence imaging of perovskite solar cells', Progress in Photovoltaics: Research and Applications, vol. 23, pp. 1697 - 1705, http://dx.doi.org/10.1002/pip.2716
    Journal articles | 2014
    Shen C; Kampwerth H; Green MA, 2014, 'Photoluminescence based open circuit voltage and effective lifetime images re-interpretation for solar cells: The influence of horizontal balancing currents', Solar Energy Materials and Solar Cells, vol. 130, pp. 393 - 396, http://dx.doi.org/10.1016/j.solmat.2014.07.035
    Journal articles | 2013
    Shen C; Kampwerth H; Green MA; Trupke T; Carstensen J; Schutt A, 2013, 'Spatially resolved photoluminescence imaging of essential silicon solar cell parameters and comparison with CELLO measurements', Solar Energy Materials and Solar Cells, vol. 109, pp. 77 - 81, http://dx.doi.org/10.1016/j.solmat.2012.10.010
    Journal articles | 2013
    Wang K; Green MA; Kampwerth H, 2013, 'Transient photoconductance and photoluminescence from thick silicon wafers and bricks: Analytical solutions', Solar Energy Materials and Solar Cells, vol. 111, pp. 189 - 192, http://dx.doi.org/10.1016/j.solmat.2013.01.013
    Journal articles | 2013
    Wang K; McLean W; Kampwerth H, 2013, 'Transient photoluminescence from silicon wafers: Finite element analysis', JOURNAL OF APPLIED PHYSICS, vol. 114, http://dx.doi.org/10.1063/1.4826896
    Journal articles | 2008
    Kampwerth H; Trupke T; Weber JW; Augarten Y, 2008, 'Advanced luminescence based effective series resistance imaging of silicon solar cells', Applied Physics Letters, vol. 93, http://dx.doi.org/10.1063/1.2982588
  • Conference Papers | 2014
    Breitenstein O; Shen C; Kampwerth H; Green MA, 2014, 'Comparison of DLIT- and PL-based Local Solar Cell Efficiency Analysis', in Energy Procedia, Elsevier, Hamelin, Germany, pp. 2 - 12, presented at Proceedings of the 3rd International Conference on Crystalline Silicon Photovoltaics (SiliconPV 2013), Hamelin, Germany, 24 March 2014 - 27 March 2014, http://dx.doi.org/10.1016/j.egypro.2013.07.243
    Conference Papers | 2012
    Chen C; Kampwerth H; Green MA, 2012, 'Spatially-Resolved Luminescence Imaging of All Essential Silicon Solar Cell Parameters', in Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE, IEEE, Austin, Texas, USA, pp. 001855 - 001859, presented at 38th IEEE Photovoltaic Specialist Conference, Austin, Texas, USA, 03 June 2012 - 08 June 2012, http://dx.doi.org/10.1109/PVSC.2012.6317955
    Conference Papers | 2008
    Kasemann M; Kwapil W; Schubert M; Habenicht H; Walter B; The M; Kontermann S; Rein S; Breitenstein O; Bauer J; Lotnyk A; Michl B; Nagel H; Foell H; Schuett A; Carstensen J; Trupke T; Augarten Y; Kampwerth H; Bardos RA; Pingel S; Berghold S; Warta W; Glunz S, 2008, 'Spatially Resolved Silicon Solar Cell Characterization Using Infrared Imaging Methods', in IEEE (ed.), Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE, 33rd IEEE Photovoltaic Specialists Conference, San Diego, CA, USA, pp. 1 - 7, presented at 33rd IEEE Photovoltaic Specialists Conference, San Diego, CA, USA, 11 May 2008 - 16 May 2008, http://dx.doi.org/10.1109/PVSC.2008.4922478