JEOL JEM-ARM300F2 -GrandARM2- AC-S/TEM

Analyse a wide range of materials with imaging and spectroscopy at the atomic level
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2025-02-03-joel-grand-arm-emu

Description

The JEM-ARM300F2 (GrandARM) is a 300 kV double aberration-corrected transmission electron microscope (AC-TEM) with up to 53 pm resolutions in both STEM and TEM modes with x-ray energy dispersive spectroscopy (XEDS), electron energy loss spectroscopy (EELS), and segmented and 4D-STEM detectors for electric and magnetic field mapping. The GrandARM can be used to analyse a wide range of materials with imaging and spectroscopy at the atomic level, including nanoparticles and thin films and can utilise our range of in-situ holders for dynamic experiments.

Specifications

  • Cold field emission gun 60, 80 & 300 kV operating voltage with <0.33 eV energy spread

  • 50 pm (lattice resolution) at 300 kV, Cs corrected.
    • 53 pm at 300kV
    • 96 pm at 80kV STEM, C corrected.
    • Gatan OneView Camera (4k x 4k) for aberration corrected High Resolution TEM 
    • Gatan K3 IS Direct Electron Detector for in-situ TEM, Energy Filtered imaging and Diffraction and 4D-STEM 
    • JEOL ADF and BF STEM detectors 
    • JEOL Segmented SAAF STEM detector
    • Dual 158mm2 JEOL X-ray Energy Dispersive Spectrometers (XEDS) with a total collection area of 1.4 steradian. 
    • Gatan Continuum K3 (model 1069) Electron Energy Loss Spectrometer (EELS) 0.35 eV energy resolution
    • JEOL Low Background Double Tilt Holders 
    • JEOL Single Tilt Holders 
    • JEOL High Tilt Holders (±70°) 
    • JEOL Liquid Nitrogen Cooling Holder 
    • Hummingbird 9 contact Heating and Biasing 
    • Hummingbird Liquid Flow cell 
    • Hummingbird Gas heating holder
    • Proto chips Atmosphere in-situ holder 
    • Simple Origin cryo-transfer holder 
    • Fischione Gas/Vacuum transfer holder

Applications

  • Nanoparticles for catalysis, nanomedicine 
  • Battery/Fuel Cell materials 
  • Metals and alloys 
  • Semiconductors 
  • Photovoltaics 
  • Ferroelectric materials

Capabilities 

    • High Resolution TEM (HRTEM)

    • Negative Spherical Aberration Imaging (NSCI)

    • Electron Diffraction

    • Beam sensitive materials 

    • Low dose TEM

    • Energy-filtered TEM (EFTEM)

    • High-angle annular dark field STEM (HAADF)

    • Annular bright field STEM (ABF) 

    • Differential Phase Contrast STEM (DPC)

    • 4D-STEM

    • Lorentz TEM

    • Elemental mapping 

    • X-ray Energy Dispersive Spectroscopy (XEDS, EDS, EDX)

    • Electron Energy Loss Spectroscopy (EELS)

    • 3D electron tomography

    • In-situ movie capture, heating-biasing, gas heating and  liquid flow

Publishing Microscopy Data Acquired on the JEOL GrandARM
      • Drop cast nanoparticles 
      • Ga or plasma FIB details 
      • Mechanical Polishing etc.
      • Manufacturer: JEOL 
      • Model: JEM-ARM300F2 
      • Type: Aberration Corrected S/TEM (AC-STEM)
      • Accelerating voltage (kV)
      • Detector(s) used for imaging
      • Scalebars can be added or removed from images in the export options.

    Acknowledgement:

    “The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.”

    Credit EMU staff: Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.

    Don’t forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.

Funding partners

Related instruments

Instrument location

Electron Microscope Unit

B29b, Basement
Hilmer Building (E10)
UNSW Sydney, NSW 2033

Access – To discuss training or how your project could benefit from using this microscope, please contact EMUACTEM@unsw.edu.au and fill in the GrandARM access form.
GrandARM access form

Professor Richard Tilley

Director Electron Microscope Unit
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    r.tilley@unsw.edu.au

Associate Professor Shery Chang

Associate director
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    shery.chang@unsw.edu.au

Dr Richard Webster

Research Associate
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    r.webster@unsw.edu.au

Dr. Soshan Cheong

Academic Staff
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    s.cheong@unsw.edu.au

Parent facility

Electron Microscope Unit (EMU)

The Electron Microscope Unit is comprehensively equipped with the highest specification and latest transmission electron microscopes, scanning electron microscopes and focused ion beam instruments. We offer a wide range of sample preparation facilities for materials and biological samples.

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