JEOL JEM-F200 S/TEM (F10)

High brightness cold-field emission gun capable of imaging atomic structures
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2025-01-28-joel-f200-f10

Description

The JEM-F200 in F10 is high-resolution analytical (scanning) transmission electron microscope (S/TEM). This microscope has a high brightness cold-field emission gun capable of imaging atomic structures (HRTEM), electron diffraction and fast chemical elemental mapping using X-ray energy dispersive Spectroscopy (XEDS).

Specifications

  •  Cold field-emission electron gun 80-200 kV operating voltage with <0.35 eV energy spread

  • 0.1 nm (lattice resolution) at 200kV

  • 0.16 nm (lattice resolution) at 200kV
    • Gatan OneView IS camera (25 fps @ 4k x 4k) capable of in-situ TEM and 4D-STEM 
    • JEOL ADF and BF STEM detectors
    • 100 mm2 JEOL X-ray energy-dispersive spectroscopy (XEDS), with a collection angle of 0.9 steradian.
    • JEOL Low Background Double Tilt Holders 
    • JEOL Single Tilt Holders ·
    • JEOL High Tilt Holders (± 80°) 
    • Simple Origin cryo-transfer holder 
    • Fischione Gas/Vacuum transfer holder

Publishing Microscopy Data Acquired on the JEOL F200
      • Drop cast nanoparticles 
      • Ga or plasma FIB details 
      • Mechanical Polishing etc.
      • Manufacturer: JEOL 
      • Model: JEM-F200 
      • Type: Transmission Electron Microscope (S/TEM)
      • Accelerating voltage (80 or 200 kV)
      • Detector(s) used for imaging
      • Scalebars can be added or removed from images in the export options.

    Acknowledgement:

    “The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.”

    Credit EMU staff: Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.

    Don’t forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.

Applications

  • Materials Science
  • Semi-conductors
  • Solar and battery materials
  • Medical Sciences

Capabilities

  • High Resolution TEM (HRTEM) 
  • Dark Field TEM (DF-TEM)
  • Electron Diffraction 
  • Beam-sensitive materials 
  • High-angle annular dark field STEM (HAADF) · Annular bright field STEM (ABF) 
  • Lorentz TEM 
  • Elemental mapping 
  • X-ray Energy Dispersive Spectroscopy (XEDS, EDS, EDX)

Funding partners

Related instruments

Instrument location

Electron Microscope Unit

B75, Basement
June Griffith Building (F10)
UNSW Sydney, NSW 2033

Access – To discuss training or how your project could benefit from using this microscope, please contact the EMU using the enquiries form or  email EMUAdmin@unsw.edu.au

Dr Richard Webster

Research Associate
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    Email
    k.privat@unsw.edu.au

Dr. Soshan Cheong

Academic Staff
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    s.cheong@unsw.edu.au

Dr. Zeno Ramadhan

Technical Staff
  • Send email envelope icon
    Email
    z.ramadhan@unsw.edu.au

Parent facility

Electron Microscope Unit (EMU)

The Electron Microscope Unit is comprehensively equipped with the highest specification and latest transmission electron microscopes, scanning electron microscopes and focused ion beam instruments. We offer a wide range of sample preparation facilities for materials and biological samples.

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