Bruker Dimension Icon
Description
The Bruker Dimension Icon® is an advanced atomic force microscope (AFM). AFM is a very high-resolution type of Scanning probe microscopy (SPM) which acquires data by “feeling” or “touching” the surface of a sample with a mechanical probe in air or liquid.
The Dimension Icon features the Bruker PeakForce Tapping technology, PeakForce QNM (Quantitative Nanomechanical Mapping) and the Bruker ScanAsyst® software, automating the optimisation of scanning parameters for users to obtain quality images and mapping of mechanical properties /conductivity/potential/electrochemical properties.
Specifications
- Xyz Scan range: 90 x 90 x 10 um3
- Controller: NanoScope V
- Sample size/holder: ≤ 210mm diameter, ≤15mm thick
- Deflection detection: Super luminescent diode λ = 650-695nm
Applications
Topographic imaging
Quantitative Force-Volume Mapping
Conductivity with PeakForce TUNA
Surface potential with PeakForce KPFM™
Electrochemistry with PeakForce SECM
Datacube
Contact resonance
Piezoresponse Microscopy
Instrument location
Katharina Gaus Light Microscopy Facility
Room LG24, Lower Ground
Lowy Cancer Research Centre (C25)
UNSW Sydney, NSW 2033
Phone: 02 9065 5306
Email: KGlmf@unsw.edu.au
Dr Alex Macmillan
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Email
alex.macmillan@unsw.edu.au
Dr Michael Carnell
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Email
m.carnell@unsw.edu.au
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