JPK Nanowizard 4 XP with Hybrid stage
Simultaneously measures mechanical properties like elasticity and adhesion alongside topography and optical microscopy
Description
The NanoWizard® 4 XP with Hybrid stage atomic force microscope is an advanced Atomic Force Microscope (AFM) mounted on a fluorescence widefield microscope. It simultaneously measures mechanical properties like elasticity and adhesion alongside topography and optical microscopy making it ideal for studying cells, tissues, and biomaterials.
Specifications
- Hybrid stage Piezo electric scanner: 200 x 200 x 200 µm 3 XYZ scan range
- Nanowizard 4 XP head piezo electric scanner: 100 x 100 x 15 µm 3 XYZ scan range
- Hybrid stage motorized XY: 20mm x 20mm for large sample tiling, correction of sample tilt
- Temperature control: petri dish heater and JPK BioCell II (for coverslips)
- Software: V7
- Probe holders: fixed spring cantilever holder for air and liquid, side view, directdrive.
- Deflection detection: IR super luminescent diode λ= 850nm
- Topview optical module for opaque samples
- Nikon Ti-U inverted microscope(widefield, brightfield & epifluorescence)
- High speed Andor Zyla CCD camera, fully integrated
- Direct overlay of optical and AFM images
Applications
- Topographic Imaging
- Mechanical Properties on soft samples
- Optical microscopy correlation
- Single molecules and membranes
- Cell-substrate / Cell-cell spectroscopy (with 200um long z range)
- Micro rheology
Instrument location
Katharina Gaus Light Microscopy Facility
Room LG24, Lower Ground
Lowy Cancer Research Centre (C25)
UNSW Sydney, NSW 2033
Phone: 02 9065 5306
Email: KGlmf@unsw.edu.au
Dr Alex Macmillan
Head of KGLMF
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Email
alex.macmillan@unsw.edu.au
Dr Michael Carnell
Senior Lecturer
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Email
m.carnell@unsw.edu.au
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