FEI Tecnai T20 TEM
Description
The FEI Tecnai transmission electron microscope (TEM) T20 is a versatile instrument equipped with a Gatan Orius 4K large field of view camera located below the column. This microscope also features a Fischione Model 3000 Annular Dark Field (ADF) Detector which is designed for high-resolution scanning transmission electron microscopy (STEM) imaging. This Microscope is utilised for routine TEM imaging and diffraction useful for imaging nanoparticles, stained polymer sections and biological samples.
Specifications
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LaB6 thermionic electron gun 200 kV operating voltage
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0.2 nm (lattice resolution) at 200kV
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1 nm (line resolution) at 200kV
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- Gatan Orius 4k x 2k CMOS camera
- Fischione HAADF STEM detector
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- FEI Single Tilt Holder
- FEI Double Tilt Analytical holder (+/- 80-degree tilt angle)
Publishing Microscopy Data Acquired on the FEI Tecnai T20
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- Nanoparticle Drop-casting
- Chemical fixation, dehydration, critical point drying
- Mounting in resin
- Staining
- Ultramicrotomy
- TEM Grid details
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- Manufacturer: FEI
- Model: Tecnai T20
- Type: LaB6
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- Accelerating voltage (200 kV)
- Detector(s) used for imaging (CMOS Camera, HAADF-STEM)
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- Adjustments to contrast/brightness
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- Scalebars can be added or removed from images in the export options.
Acknowledgement:
“The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Electron Microscope Unit (EMU) within the Mark Wainwright Analytical Centre (MWAC) at UNSW Sydney.”
Credit EMU staff: Feel free to mention EMU staff who have assisted you with your work! If staff have been involved with your work beyond basic training and support (e.g., project design, complex data/image processing, independent imaging/analysis, manuscript preparation), it may be appropriate to discuss co-authorship with the relevant staff and your supervisor.
Don’t forget to email the EMU lab manager with a copy of your publication to claim 2 hours of free microscopy time.
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Applications
- Nanoparticles for catalysis, nanomedicine
- Metals and alloys
- Semiconductors
- Structural Biology
- Pathology
- Polymer Science
- Life Sciences
- Biomaterials
- Solar and battery materials
- Earth sciences
- Pathology and medical sciences
- Cultural heritage materials
- Planetology
Capabilities
- TEM imaging
- Dark Field TEM (DF-TEM)
- Electron Diffraction
- Beam-sensitive materials
- High-angle annular dark field STEM (HAADF)
Instrument location
Electron Microscope Unit
B73, Basement
June Griffith Building (F10)
UNSW Sydney, NSW 2033
Access – To discuss training or how your project could benefit from using this microscope, please contact the EMU using the enquiries form or email EMUAdmin@unsw.edu.au
Dr Rhianon Kuchel
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Email
r.kuchel@unsw.edu.au
Dr. Zeno Ramadhan
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Email
z.ramadhan@unsw.edu.au
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