PANalytical Aeris XRD
Determining structure in microcrystalline powders

Description
General purpose benchtop X-ray diffractometer (XRD) for determining structure in microcrystalline powders.
Specifications
- 600 W Cu anode – low power but short path length to minimise air attenuation.
- 6 position sample changer.
Applications
- Material structure determination & identification
- Quantitative phase analysis
Related instruments
Instrument location
X-ray Diffraction Laboratory
Room G65
June Griffith Building (F10)
UNSW Sydney, NSW 2033
Email: xrdlab@unsw.edu.au
Yu Wang
Senior Technical Officer
-
Email
yu.wang@unsw.edu.au
Saroj Kumar Bhattacharyya
Technical Officer
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Email
saroj.bhattacharyya@unsw.edu.au
Moein Seyfouri
Research Fellow Analytical Chemistry Facility
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Email
m.seyfouri@unsw.edu.au
Parent facility
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